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ILX Lightwave > Laser Diode Test Systems
LRS-9424B Laser Reliability and Burn-In Test System
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Features
- High density, low cost per channel
- Supports simultaneous multiple temperatures from 40°C to 150°C
- Optimized for TO-Can and TOSA package
- Standard current ranges available up to 400mA
- Monitored burn-in with ACC, APC, and LIV test modes
- Use internal photodiodes or front-facet photodiode array
- Modular design allows flexible configuration and future expansion
- Secure data management
- Test and Measurement World's 2005 Best in Test Honorable Mention
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The LRS-9424B Laser Reliability and Burn-In Test System is the second generation of ILX Lightwaves successful 9424 platform and offers
precision and flexibility at an affordable price. With up to 1024 devices in the LRS-9424Bs compact chamber, you will be able to increase throughput and
lower your overall cost of test. The LRS-9424Bs proven laser control technology gives you the flexibility to process TO-Can lasers and TOSA assemblies
in the same system.
The LRS-9424B incorporates precise, individual fixture temperature control allowing you to run up to 32 independent tests each at a unique temperature.
Careful attention to thermal management, high accuracy control and measurement circuitry, and multiple levels of laser protection deliver 0.1% long-term
stability and ensure data continuity even through power disruptions. Standard control modes support ACC, APC, and LIV tests, which are easily configured
using the systems ReliaTest control software.
The LRS-9424B includes ReliaTest version 2.0 system control software with enhanced speed and data export capability. Standard ReliaTest features
include easy test scenario configuration, flexible data graphing and reporting, and secure data management.
The LRS-9424Bs low initial purchase price, outstanding flexibility, and long-term reliability will make you more competitive today and more competitive
tomorrow.
For specifications on the LRS-9424B, please refer to the LRS-9424B product brochure.
Last updated: June 18, 2008 |
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