Laser Reliability and Burn-In Test System - LRS-9424B

	ILX Lightwave > Laser Diode Test Systems LRS-9424B Laser Reliability and Burn-In Test System	Features High density, low cost per channel Supports simultaneous multiple temperatures from 40°C to 150°C Optimized for TO-Can and TOSA package Standard current ranges available up to 400mA Monitored burn-in with ACC, APC, and LIV test modes Use internal photodiodes or front-facet photodiode array Modular design allows flexible configuration and future expansion Secure data management Test and Measurement World's 2005 Best in Test Honorable Mention

	The LRS-9424B Laser Reliability and Burn-In Test System is the second generation of ILX Lightwave’s successful 9424 platform and offers precision and flexibility at an affordable price. With up to 1024 devices in the LRS-9424B’s compact chamber, you’ll be able to increase throughput and lower your overall cost of test. The LRS-9424B’s proven laser control technology gives you the flexibility to process TO-Can lasers and TOSA assemblies in the same system. The LRS-9424B incorporates precise, individual fixture temperature control allowing you to run up to 32 independent tests each at a unique temperature. Careful attention to thermal management, high accuracy control and measurement circuitry, and multiple levels of laser protection deliver 0.1% long-term stability and ensure data continuity even through power disruptions. Standard control modes support ACC, APC, and LIV tests, which are easily configured using the system’s ReliaTest control software. The LRS-9424B includes ReliaTest version 2.0 system control software with enhanced speed and data export capability. Standard ReliaTest features include easy test scenario configuration, flexible data graphing and reporting, and secure data management. The LRS-9424B’s low initial purchase price, outstanding flexibility, and long-term reliability will make you more competitive today and more competitive tomorrow. For specifications on the LRS-9424B, please refer to the LRS-9424B product brochure. Last updated: January 31, 2006		LRS-9424B Product Brochure LRS-9424B System Service Solutions LRS-9424B Current Source and Monitor Photodiode Measurement Stability Differences between Threshold Current Calculation Methods LRS-9424 Heat Sink Temperature Stability When Chamber Door Opens LRS-9424B Heat Sink Temperature Uniformity WHITE PAPER: Laser Diode Burn-In and Reliability Testing Optimize Testing for Threshold Calculation Repeatability WHITE PAPER: Reducing the Cost of Test in Laser Diode Manufacturing WHITE PAPER: Reliability Counts for Laser Diodes ReliaTest L/I Threshold Calculations Repeatability of Laser Diode Threshold Current Measurement Using the LRS-9424 Testing Bond Quality by Measuring Thermal Resistance of Laser Diodes