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NEW ILX LIGHTWAVE PRODUCTS


NEW LDX-36000 Series
High Power Laser Diode Current Sources
High Power Laser Diode Current Source LDX-36000
More information on the LDX-36000 Series
Features
  • Output current to 220A QCW and 125A CW
  • Compliance voltage from 10V to 70V
  • Multiple laser diode protection features
  • Precision set-point control and voltage measurement
  • Temperature monitor for thermistor input
  • Photodiode current measurement with adjustable reverse-bias
  • On-board memory for L-I-V data storage and retrieval
  • IEEE488/GPIB interface

NEW LDM-4415
Temperature Controlled CS Package Mounting Fixture
Temperature-Controlled TO-Can Fixture LDM-4990
More information on the LDM-4415
Features
  • Up to 100W heat load
  • Temperature control range from +25°C to 85°C at 100W
  • Temperature control range from +10°C to 85°C at 75W
  • Optical table mounting
  • Unobstructed access to the front of the laser diode
  • Compatible with ILX Lightwave high power current sources and temperature controllers

NEW LDM-4990
Temperature Controlled TO-Can Laser Diode Mounting Fixture
Temperature-Controlled TO-Can Fixture LDM-4990
More information on the LDM-4990
Features
  • Accepts 5.4mm, 5.6mm, and 9mm TO-can packaged laser diodes
  • Temperature control range from -20°C to +85°C with nitrogen purge capability
  • Quick device insertion and removal without special tools
  • Configurable pin-out header
  • Optional mount for ILX OMH power and wavelength measurement heads
  • Compatible with ILX Lightwave current sources and temperature controllers

NEW LRS-9424B
Laser Reliability and Burn-In Test System
Laser Diode Reliability and Burn-In Test System
More information on the LRS-9424B
Features
  • High density, low cost per channel
  • Supports simultaneous multiple temperatures from 40°C to 150°C
  • Optimized for TO-Can and TOSA package
  • Standard current ranges available up to 400mA
  • Monitored burn-in with ACC, APC, and LIV test modes
  • Use internal photodiodes or front-facet photodiode array
  • Modular design allows flexible configuration and future expansion
  • Secure data management
  • Test and Measurement World's 2005 Best in Test Honorable Mention